FEI Tecnai F20

The FEI Tecnai F20 is 200kV field emission gun (FEG) high resolution and analytical TEM/STEM, which was installed in June 2002.

The microscope has a SuperTwin objective lens with a Cs of 1.2 mm. 

The main control and analysis interface on the Tecnai is digital. 

Facilities available on this instrument include:

Ultra high tilt tomography (±80º), single tilt electrical, single tilt and double tilt low background sample holders

A Gatan Imaging Filter (GIF) 200, fitted with a 1k x 1k CCD camera, for energy-filtered diffraction, imaging and EELS

Off-axis STEM bright-field (BF) and dark-field (DF) detectors

On-axis high sensitivity (single electron detection) Fischione Model 3000 high angle annular dark field (HAADF) detector for high-resolution Z-contrast imaging

An EDAX r-TEM ultra-thin window (UTW) X-ray detector