The FEI Tecnai F20 is 200kV field emission gun (FEG) high resolution and analytical TEM/STEM, which was installed in June 2002.
The microscope has a SuperTwin objective lens with a Cs of 1.2 mm.
The main control and analysis interface on the Tecnai is digital.
Facilities available on this instrument include:
Ultra high tilt tomography (±80º), single tilt electrical, single tilt and double tilt low background sample holders
A Gatan Imaging Filter (GIF) 200, fitted with a 1k x 1k CCD camera, for energy-filtered diffraction, imaging and EELS
Off-axis STEM bright-field (BF) and dark-field (DF) detectors
On-axis high sensitivity (single electron detection) Fischione Model 3000 high angle annular dark field (HAADF) detector for high-resolution Z-contrast imaging
An EDAX r-TEM ultra-thin window (UTW) X-ray detector