TF Spectra 300

Thermo Fisher Scientific Spectra 300 is a state-of-the-art FEG Monochromated and Probe corrected Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 40-300 kV. It is specifically designed to be a multifunction tool for all materials science and semiconductor applications with access to soft and electron sensitive samples. 

This monochromated instrument enables a host of multi-modal analytical capabilities to be conducted on the atomic level including: electron energy loss spectroscopy (EELS), energy dispersive X-ray spectroscopy (EDX), Lorentz microscopy, holography, tomography, integrated differential phase contrast, scanning electron diffraction (SED), precession electron diffraction (PED), and 4D-STEM.  

The high-energy-resolution extreme field emission gun (X-FEG)/Mono monochromator can be automatically tuned to give a STEM spatial resolution of ~50 pm and an energy resolution of 90 meV at 300kV. At 40 kV, with monochromator, the energy resolution can reach ~50 meV. Both core and low loss EELS can be acquired with the Gatan Continuum detector, which enables chemical analysis and mapping of plasmons and valence states, as well as collection of EFTEM and energy filtered SED datasets. 

The super-X system has 4 solid state detectors around the sample to enable an efficient collection of X-rays. A new Panther segmented STEM detector collects scattered electrons at 4 collection angles concurrently, from bright field (BF) through to high angle annualar dark field (HAADF). The segmentation of these detectors enables techniques such as integrated differential phase contrast (iDPC). ThermoFisher's 4k Ceta camera and Quantum Detectors' Merlin direct electron camera can image both in low dose TEM and fast diffraction mode to support a wide range of experiments and materials. 

The microscope is compatible specimen holders available in the WEMS: single tilt, double tilt, tomography, liquid He, liquid N2, heating, liquid/electrochemistry, inert transfer.